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COC Burn-in Test System

COC Burn-in Test System

COC Burn-in Test System is an efficient automated system specifically designed for large-scale production aging and reliability testing of semiconductor laser chips (COC). The equipment integrates high-density multi-channel driving, independent precise temperature control, online power monitoring, and intelligent data management, covering the batch aging test requirements of various laser COC chips such as DFB, DML, EML, and VCSEL.
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Wide range of applications

  • Supports laser chips, LiDAR, and automotive optoelectronics, among other fields

Ultra-high channel density

  • A single system supports up to 4224 channels of 4-quadrant source measurement units for simultaneous aging

Independent and precise temperature control

  • Each fixture is equipped with independent heating, temperature control, monitoring, overtemperature protection, and cooling units, enabling energy-saving temperature control in different zones and avoiding energy waste as well as temperature unevenness in overall temperature control

High-precision drive power supply

  • Equipped with ACC (automatic current control) mode, it maintains a constant aging current when contact resistance varies

Flexibility

  • The driver board employs a coordinated mechanism of hardware protection and software control to eliminate risks such as EOS, overcurrent, and overvoltage at the source.

  • Supports external PD current acquisition, includes threshold current (Ith) analysis, with test repeatability better than ±1%