Tri-temperature Laser Chip Test System

Tri-temperature Laser Chip Test System is a high-precision automated testing system designed specifically for performance verification and batch screening of laser chips.

The system integrates functional modules including blue tape ID recognition, die pick-up from blue dicing tape frames, chip handling, ambient and high-temperature testing, and automatic sorting and unloading. It uses dual-mover linear motors, high-precision motorized linear stages, and granite platforms to ensure long -term operational stability and repeatability, fully covering both R&D verification and mass-production screening scenarios.

Wide range of applications

  • Batch screening and R&D verification of laser chips

High accuracy and repeatability

  • LIV uses a 10mm diameter photosensitive surface detector, and spectroscopy uses a collimating lens. It features an automatic calibration function to ensure accurate power and wavelength data

  • LD current ranging from 0-1000mA (pulse: 3000mA), voltage from 0-15V (accuracy 0.3%), with the option to connect an external source meter for expansion

High automation

  • The probe pressure and suction nozzle suction pressure are adjustable

  • Bare dies are automatically stripped by ejector pins paired with dual linear motors, and the equipment supports rule-based automatic sorting of multiple blue tapes

  • A novel intelligent multi-angle recognition system, coupled with a high-precision electric motorized axis, facilitates rapid position correction and automatic pin insertion

Flexibility

  • The host computer presents the LIV curve and spectral diagram in real-time

  • Each power supply is independently protected by a circuit breaker, with the option to select a UPS, equipped with safety interlocks and EMO emergency stop

  • Integrated DC acquisition card with automatic chip SN reading, plus a secondary development interface for production line integration and custom process flows